Characterisation of thin films by phase modulated spectroscopic ellipsometry /
Saved in:
| OCLC: | 41754323 |
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| 主要作者: | |
| 企业作者: | |
| 语言: | English |
| 出版: |
Mumbai :
Bhabha Atomic Research Centre,
1998.
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| 主题: | |
| Global Resources Program: | South Asia Materials Project (SAMP) |
| 格式: | Monograph Microform Note that CRL will digitize material from the collection when copyright allows. |