Characterisation of thin films by phase modulated spectroscopic ellipsometry /
Guardado en:
| OCLC: | 41754323 |
|---|---|
| Autor principal: | |
| Autor Corporativo: | |
| Lenguaje: | English |
| Publicado: |
Mumbai :
Bhabha Atomic Research Centre,
1998.
|
| Materias: | |
| Global Resources Program: | South Asia Materials Project (SAMP) |
| Formato: | Monograph Microform Note that CRL will digitize material from the collection when copyright allows. |