Multimode scanning probe microscopy in characterizing precision optical thin films and multilayers /

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Bibliografische gegevens
OCLC:56413564
Coauteur: Bhabha Atomic Research Centre
Andere auteurs: Sahoo, N. K.
Taal:English
Gepubliceerd in: Mumbai : Bhabha Atomic Research Centre, 2001.
Reeks:BARC external ; BARC/2001/E/032.
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