Multimode scanning probe microscopy in characterizing precision optical thin films and multilayers /

Gorde:
Xehetasun bibliografikoak
OCLC:56413564
Erakunde egilea: Bhabha Atomic Research Centre
Beste egile batzuk: Sahoo, N. K.
Hizkuntza:English
Argitaratua: Mumbai : Bhabha Atomic Research Centre, 2001.
Saila:BARC external ; BARC/2001/E/032.
Gaiak:
Formatua:

Government Document Monograph Microform

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