Multimode scanning probe microscopy in characterizing precision optical thin films and multilayers /
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| OCLC: | 56413564 |
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| 企業作者: | |
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| 語言: | English |
| 出版: |
Mumbai :
Bhabha Atomic Research Centre,
2001.
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| 叢編: | BARC external ;
BARC/2001/E/032. |
| 主題: | |
| 格式: | Government Document Monograph Microform Note that CRL will digitize material from the collection when copyright allows. |
| Item Description: | At head of title: Government of India, Atomic Energy Commission. |
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| 實物描述: | 45 p. : ill. ; 29 cm. |
| 參考書目: | Includes bibliographical references (p. 45) |