Characterisation of thin films by phase modulated spectroscopic ellipsometry /
محفوظ في:
| OCLC: | 41754323 |
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| المؤلف الرئيسي: | |
| مؤلف مشترك: | |
| اللغة: | English |
| منشور في: |
Mumbai :
Bhabha Atomic Research Centre,
1998.
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| الموضوعات: | |
| Global Resources Program: | South Asia Materials Project (SAMP) |
| التنسيق: | Monograph Microform Note that CRL will digitize material from the collection when copyright allows. |