Laser-enhanced ionization spectrometry and its principles : a powerful tool for ultra-sensitive trace element analysis

Saved in:
Bibliographic Details
OCLC:35469085
Main Author: Axner, Ove
Corporate Author: Chalmers tekniska högskola. Dept. of Physics
Language:English
Published: Göteborg, Sweden : Dept. of Physics, Chalmers University of Technology, 1987.
Series:Doktorsavhandlingar vid Chalmers tekniska högskola ; ny ser., nr. 607.
Format:

Thesis Monograph

Note that CRL will digitize material from the collection when copyright allows.

Borrow this resource

Item List

Description Local Call Number Status
P-00212887 Available