Laser-enhanced ionization spectrometry and its principles : a powerful tool for ultra-sensitive trace element analysis
Guardado en:
| OCLC: | 35469085 |
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| Autor principal: | |
| Autor Corporativo: | |
| Lenguaje: | English |
| Publicado: |
Göteborg, Sweden :
Dept. of Physics, Chalmers University of Technology,
1987.
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| Colección: | Doktorsavhandlingar vid Chalmers tekniska högskola ;
ny ser., nr. 607. |
| Formato: | Tesis Monograph Note that CRL will digitize material from the collection when copyright allows. |