Magneto-optical charcacterization of deep-level defects in SiC and GaN /
Kaydedildi:
| OCLC: | 49933572 |
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| Yazar: | |
| Müşterek Yazar: | |
| Dil: | English |
| Baskı/Yayın Bilgisi: |
2002.
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| Konular: | |
| Materyal Türü: | Tez Monograph Note that CRL will digitize material from the collection when copyright allows. |