Magneto-optical charcacterization of deep-level defects in SiC and GaN /
Guardat en:
| OCLC: | 49933572 |
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| Autor principal: | |
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| Idioma: | English |
| Publicat: |
2002.
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| Format: | Thesis Monograph Note that CRL will digitize material from the collection when copyright allows. |