Magneto-optical charcacterization of deep-level defects in SiC and GaN /
Na minha lista:
| OCLC: | 49933572 |
|---|---|
| Autor principal: | |
| Autor Corporativo: | |
| Idioma: | English |
| Publicado em: |
2002.
|
| Assuntos: | |
| Formato: | Thesis Monograph Note that CRL will digitize material from the collection when copyright allows. |