Magneto-optical charcacterization of deep-level defects in SiC and GaN /
में बचाया:
| OCLC: | 49933572 |
|---|---|
| मुख्य लेखक: | |
| निगमित लेखक: | |
| भाषा: | English |
| प्रकाशित: |
2002.
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| विषय: | |
| स्वरूप: | थीसिस Monograph Note that CRL will digitize material from the collection when copyright allows. |