Wagner, M. (2002). Magneto-optical charcacterization of deep-level defects in SiC and GaN.
Chicago Style (17th ed.) CitationWagner, Matthias. Magneto-optical Charcacterization of Deep-level Defects in SiC and GaN. 2002.
MLA引文Wagner, Matthias. Magneto-optical Charcacterization of Deep-level Defects in SiC and GaN. 2002.
警告：这些引文格式不一定是100％准确.