Wagner, M. (2002). Magneto-optical charcacterization of deep-level defects in SiC and GaN.
Čikaški stil citiranja (17. izdanje)Wagner, Matthias. Magneto-optical Charcacterization of Deep-level Defects in SiC and GaN. 2002.
MLA način citiranja (8. izdanje)Wagner, Matthias. Magneto-optical Charcacterization of Deep-level Defects in SiC and GaN. 2002.
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