Modeling and simulation of defect induced faults in CMOS IC's /
Sparad:
| OCLC: | 38912157 |
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| Huvudupphovsman: | |
| Institutionell upphovsman: | |
| Språk: | English |
| Publicerad: |
Eindhoven :
Eindhoiven University of Technology,
c1995.
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| Ämnen: | |
| Materialtyp: | Lärdomsprov Konferenspublikation Monograph Note that CRL will digitize material from the collection when copyright allows. |