Modeling and simulation of defect induced faults in CMOS IC's /
Saved in:
| OCLC: | 38912157 |
|---|---|
| Main Author: | |
| Corporate Author: | |
| Language: | English |
| Published: |
Eindhoven :
Eindhoiven University of Technology,
c1995.
|
| Subjects: | |
| Format: | Thesis Conference Proceeding Monograph Note that CRL will digitize material from the collection when copyright allows. |