Spectroscopic infrared ellipsometry : components, calibration and application
Gardado en:
| OCLC: | 36015356 |
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| Autor Principal: | |
| Autor Corporativo: | |
| Idioma: | English |
| Publicado: |
Netherlands :
Technische Universiteit Eindhoven,
1995.
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| Subjects: | |
| Formato: | Thesis Monograph Note that CRL will digitize material from the collection when copyright allows. |
| Descrición Física: | 93 p. : ill. ; 24 cm. |
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| Bibliografía: | Includes bibliographical references (p. 135-137) |
| ISBN: | 9038600178 |
| Lugar de Publicación: | Netherlands. |