Spectroscopic infrared ellipsometry : components, calibration and application
Saved in:
| OCLC: | 36015356 |
|---|---|
| Main Author: | |
| Corporate Author: | |
| Language: | English |
| Published: |
Netherlands :
Technische Universiteit Eindhoven,
1995.
|
| Subjects: | |
| Format: | Thesis Monograph Note that CRL will digitize material from the collection when copyright allows. |