Spectroscopic infrared ellipsometry : components, calibration and application
Guardado en:
| OCLC: | 36015356 |
|---|---|
| Autor principal: | |
| Autor Corporativo: | |
| Lenguaje: | English |
| Publicado: |
Netherlands :
Technische Universiteit Eindhoven,
1995.
|
| Materias: | |
| Formato: | Tesis Monograph Note that CRL will digitize material from the collection when copyright allows. |
| Descripción Física: | 93 p. : ill. ; 24 cm. |
|---|---|
| Bibliografía: | Includes bibliographical references (p. 135-137) |
| ISBN: | 9038600178 |
| Lugar de publicación: | Netherlands. |