Spectroscopic infrared ellipsometry : components, calibration and application
Guardat en:
| OCLC: | 36015356 |
|---|---|
| Autor principal: | |
| Autor corporatiu: | |
| Idioma: | English |
| Publicat: |
Netherlands :
Technische Universiteit Eindhoven,
1995.
|
| Matèries: | |
| Format: | Thesis Monograph Note that CRL will digitize material from the collection when copyright allows. |
| Descripció física: | 93 p. : ill. ; 24 cm. |
|---|---|
| Bibliografia: | Includes bibliographical references (p. 135-137) |
| ISBN: | 9038600178 |
| Lloc de publicació: | Netherlands. |