Untersuchungen diffusionsinduzierter Defekte in GaP mittels Transmissionselektronenmikroskopie /
में बचाया:
| OCLC: | 51538024 |
|---|---|
| मुख्य लेखक: | |
| निगमित लेखक: | |
| भाषा: | German |
| प्रकाशित: |
Germany :
Universität Kiel,
2002.
|
| स्वरूप: | थीसिस Monograph Note that CRL will digitize material from the collection when copyright allows. |