Untersuchungen diffusionsinduzierter Defekte in GaP mittels Transmissionselektronenmikroskopie /

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Bibliographic Details
OCLC:51538024
Main Author: Jäger, Christian
Corporate Author: Universität Kiel
Language:German
Published: Germany : Universität Kiel, 2002.
Format:

Thesis Monograph

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Description Local Call Number Status
P-60006916 Available