Layoutabhängige Fehleranalyse und Testsynthese integrierter CMOS Schaltungen /

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Bibliographic Details
OCLC:27035513
Main Author: Jacomet, Marcel
Corporate Author: Eidgenössische Technische Hochschule Zürich
Language:German
Published: Konstanz : Hartung-Gorre, 1991.
Edition:1. Aufl.
Series:Series in microelectronics, v. 8.
Subjects:
Digital integrated circuits > Design and construction > Data processing.
Metal oxide semiconductors > Testing > Data processing.
Integrated circuits > Fault tolerance.
Format:

Thesis Monograph

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