The electrical activity of defects created in silicon single crystals during ion implantation /

Wedi'i Gadw mewn:
Manylion Llyfryddiaeth
OCLC:3928247
Prif Awdur: Andersson, Åke
Awdur Corfforaethol: Chalmers tekniska högskola
Iaith:English
Cyhoeddwyd: Göteborg, 1973.
Cyfres:Doktorsavhandlingar vid Chalmers tekniska högskola.
Pynciau:
Fformat:

Traethawd Ymchwil Monograph

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