Graphischer Einsatz zyklusorientierter Tests im digitalen VLSI-Entwurf /
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| OCLC: | 50593976 |
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| 主要作者: | |
| 企业作者: | |
| 语言: | German |
| 出版: |
1993.
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| 格式: | Thesis Monograph Note that CRL will digitize material from the collection when copyright allows. |
| 实物描述: | 180 p. |
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| Place of Publication: | Germany. |