Application of optical perturbation spectroscopy for studies of complex defects and excitons in semiconductors /
Zapisane w:
| OCLC: | 32332775 |
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| 1. autor: | |
| Korporacja: | |
| Język: | English |
| Wydane: |
Linköping, Sweden :
Dept. of Physics and Measurement Technology, Linköping University,
1988.
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| Seria: | Linköping studies in science and technology. Dissertations ;
no. 191, |
| Hasła przedmiotowe: | |
| Format: | Praca dyplomowa Monograph Note that CRL will digitize material from the collection when copyright allows. |