Application of optical perturbation spectroscopy for studies of complex defects and excitons in semiconductors /
שמור ב:
| OCLC: | 32332775 |
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| מחבר ראשי: | |
| מחבר תאגידי: | |
| שפה: | English |
| יצא לאור: |
Linköping, Sweden :
Dept. of Physics and Measurement Technology, Linköping University,
1988.
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| סדרה: | Linköping studies in science and technology. Dissertations ;
no. 191, |
| נושאים: | |
| פורמט: | Thesis Monograph Note that CRL will digitize material from the collection when copyright allows. |