Application of optical perturbation spectroscopy for studies of complex defects and excitons in semiconductors /
Zapisane w:
| OCLC: | 32332775 |
|---|---|
| 1. autor: | |
| Korporacja: | |
| Język: | English |
| Wydane: |
Linköping, Sweden :
Dept. of Physics and Measurement Technology, Linköping University,
1988.
|
| Seria: | Linköping studies in science and technology. Dissertations ;
no. 191, |
| Hasła przedmiotowe: | |
| Format: | Praca dyplomowa Monograph Note that CRL will digitize material from the collection when copyright allows. |
| Opis fizyczny: | 164 p. : ill. ; 24 cm. |
|---|---|
| Bibliografia: | Includes bibliographical references. |
| ISBN: | 9178703719 |
| ISSN: | 0345-7524. |
| Miejsce wydania: | Sweden. |