Application of optical perturbation spectroscopy for studies of complex defects and excitons in semiconductors /
Sábháilte in:
| OCLC: | 32332775 |
|---|---|
| Príomhchruthaitheoir: | |
| Údar corparáideach: | |
| Teanga: | English |
| Foilsithe / Cruthaithe: |
Linköping, Sweden :
Dept. of Physics and Measurement Technology, Linköping University,
1988.
|
| Sraith: | Linköping studies in science and technology. Dissertations ;
no. 191, |
| Ábhair: | |
| Formáid: | Tráchtas Monograph Note that CRL will digitize material from the collection when copyright allows. |
| Cur síos fisiciúil: | 164 p. : ill. ; 24 cm. |
|---|---|
| Leabharliosta: | Includes bibliographical references. |
| ISBN: | 9178703719 |
| ISSN: | 0345-7524. |
| Áit a fhoilsithe: | Sweden. |