Application of optical perturbation spectroscopy for studies of complex defects and excitons in semiconductors /
Guardado en:
| OCLC: | 32332775 |
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| Autor principal: | |
| Autor Corporativo: | |
| Lenguaje: | English |
| Publicado: |
Linköping, Sweden :
Dept. of Physics and Measurement Technology, Linköping University,
1988.
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| Colección: | Linköping studies in science and technology. Dissertations ;
no. 191, |
| Materias: | |
| Formato: | Tesis Monograph Note that CRL will digitize material from the collection when copyright allows. |
| Descripción Física: | 164 p. : ill. ; 24 cm. |
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| Bibliografía: | Includes bibliographical references. |
| ISBN: | 9178703719 |
| ISSN: | 0345-7524. |
| Lugar de publicación: | Sweden. |