Study of an intelligent measurement system of two phase flows based on electrical resistance tomography /

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Bibliographic Details
OCLC:55677664
Main Author: Deng, Xian
Corporate Author: Tianjin da xue
Language:Chinese
Published: 2001.
Format:

Thesis Monograph

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245 1 0 |a Study of an intelligent measurement system of two phase flows based on electrical resistance tomography /  |c Xian Deng. 
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502 |b doctoral  |c Tientsin University  |d 2001. 
546 |a In Chinese; Summary in English. 
710 2 |a Tianjin da xue. 
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