Multimode scanning probe microscopy in characterizing precision optical thin films and multilayers /
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| OCLC: | 56413564 |
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| 企业作者: | |
| 其他作者: | |
| 语言: | English |
| 出版: |
Mumbai :
Bhabha Atomic Research Centre,
2001.
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| 丛编: | BARC external ;
BARC/2001/E/032. |
| 主题: | |
| 格式: | Government Document Monograph Microform Note that CRL will digitize material from the collection when copyright allows. |