Multimode scanning probe microscopy in characterizing precision optical thin films and multilayers /
Shranjeno v:
| OCLC: | 56413564 |
|---|---|
| Korporativna značnica: | |
| Drugi avtorji: | |
| Jezik: | English |
| Izdano: |
Mumbai :
Bhabha Atomic Research Centre,
2001.
|
| Serija: | BARC external ;
BARC/2001/E/032. |
| Teme: | |
| Format: | Government Document Monograph Microform Note that CRL will digitize material from the collection when copyright allows. |