Multimode scanning probe microscopy in characterizing precision optical thin films and multilayers /
Сохранить в:
| OCLC: | 56413564 |
|---|---|
| Соавтор: | |
| Другие авторы: | |
| Язык: | English |
| Опубликовано: |
Mumbai :
Bhabha Atomic Research Centre,
2001.
|
| Серии: | BARC external ;
BARC/2001/E/032. |
| Предметы: | |
| Формат: | Government Document Monograph Microform Note that CRL will digitize material from the collection when copyright allows. |