Multimode scanning probe microscopy in characterizing precision optical thin films and multilayers /

में बचाया:
ग्रंथसूची विवरण
OCLC:56413564
निगमित लेखक: Bhabha Atomic Research Centre
अन्य लेखक: Sahoo, N. K.
भाषा:English
प्रकाशित: Mumbai : Bhabha Atomic Research Centre, 2001.
श्रृंखला:BARC external ; BARC/2001/E/032.
विषय:
स्वरूप:

सरकारी दस्तावेज Monograph Microform

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