Multimode scanning probe microscopy in characterizing precision optical thin films and multilayers /
Guardado en:
| OCLC: | 56413564 |
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| Autor Corporativo: | |
| Otros Autores: | |
| Lenguaje: | English |
| Publicado: |
Mumbai :
Bhabha Atomic Research Centre,
2001.
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| Colección: | BARC external ;
BARC/2001/E/032. |
| Materias: | |
| Formato: | Documento de Gobierno Monograph Microform Note that CRL will digitize material from the collection when copyright allows. |