Multimode scanning probe microscopy in characterizing precision optical thin films and multilayers /

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Bibliografiske detaljer
OCLC:56413564
Institution som forfatter: Bhabha Atomic Research Centre
Andre forfattere: Sahoo, N. K.
Sprog:English
Udgivet: Mumbai : Bhabha Atomic Research Centre, 2001.
Serier:BARC external ; BARC/2001/E/032.
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Government Document Monograph Microform

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