Multimode scanning probe microscopy in characterizing precision optical thin films and multilayers /

Wedi'i Gadw mewn:
Manylion Llyfryddiaeth
OCLC:56413564
Awdur Corfforaethol: Bhabha Atomic Research Centre
Awduron Eraill: Sahoo, N. K.
Iaith:English
Cyhoeddwyd: Mumbai : Bhabha Atomic Research Centre, 2001.
Cyfres:BARC external ; BARC/2001/E/032.
Pynciau:
Fformat:

Dogfen y Llywodraeth Monograph Microform

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