Multimode scanning probe microscopy in characterizing precision optical thin films and multilayers /
Guardat en:
| OCLC: | 56413564 |
|---|---|
| Autor corporatiu: | |
| Altres autors: | |
| Idioma: | English |
| Publicat: |
Mumbai :
Bhabha Atomic Research Centre,
2001.
|
| Col·lecció: | BARC external ;
BARC/2001/E/032. |
| Matèries: | |
| Format: | Document de govern Monograph Microform Note that CRL will digitize material from the collection when copyright allows. |