Multimode scanning probe microscopy in characterizing precision optical thin films and multilayers /

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Bibliografski detalji
OCLC:56413564
Autor kompanije: Bhabha Atomic Research Centre
Daljnji autori: Sahoo, N. K.
Jezik:English
Izdano: Mumbai : Bhabha Atomic Research Centre, 2001.
Serija:BARC external ; BARC/2001/E/032.
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Vladin dokument Monograph Microform

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