Multimode scanning probe microscopy in characterizing precision optical thin films and multilayers /
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OCLC: | 56413564 |
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Autor kompanije: | |
Daljnji autori: | |
Jezik: | English |
Izdano: |
Mumbai :
Bhabha Atomic Research Centre,
2001.
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Serija: | BARC external ;
BARC/2001/E/032. |
Teme: | |
Format: | Vladin dokument Monograph Microform Note that CRL will digitize material from the collection when copyright allows. |