Multimode scanning probe microscopy in characterizing precision optical thin films and multilayers /
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| OCLC: | 56413564 |
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| Corporate Author: | |
| Other Authors: | |
| Language: | English |
| Published: |
Mumbai :
Bhabha Atomic Research Centre,
2001.
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| Series: | BARC external ;
BARC/2001/E/032. |
| Subjects: | |
| Format: | Government Document Monograph Microform Note that CRL will digitize material from the collection when copyright allows. |