APA引文

Bhabha Atomic Research Centre & Sahoo, N. K. (2001). Multimode scanning probe microscopy in characterizing precision optical thin films and multilayers. Bhabha Atomic Research Centre.

Chicago Style (17th ed.) Citation

Bhabha Atomic Research Centre and N. K. Sahoo. Multimode Scanning Probe Microscopy in Characterizing Precision Optical Thin Films and Multilayers. Mumbai: Bhabha Atomic Research Centre, 2001.

MLA引文

Bhabha Atomic Research Centre and N. K. Sahoo. Multimode Scanning Probe Microscopy in Characterizing Precision Optical Thin Films and Multilayers. Bhabha Atomic Research Centre, 2001.