Cita APA

Bhabha Atomic Research Centre & Sahoo, N. K. (2001). Multimode scanning probe microscopy in characterizing precision optical thin films and multilayers. Bhabha Atomic Research Centre.

Chicago Style (17th ed.) Citation

Bhabha Atomic Research Centre i N. K. Sahoo. Multimode Scanning Probe Microscopy in Characterizing Precision Optical Thin Films and Multilayers. Mumbai: Bhabha Atomic Research Centre, 2001.

Cita MLA

Bhabha Atomic Research Centre i N. K. Sahoo. Multimode Scanning Probe Microscopy in Characterizing Precision Optical Thin Films and Multilayers. Bhabha Atomic Research Centre, 2001.