Bhabha Atomic Research Centre & Sahoo, N. K. (2001). Multimode scanning probe microscopy in characterizing precision optical thin films and multilayers. Bhabha Atomic Research Centre.
Citação norma ChicagoBhabha Atomic Research Centre and N. K. Sahoo. Multimode Scanning Probe Microscopy in Characterizing Precision Optical Thin Films and Multilayers. Mumbai: Bhabha Atomic Research Centre, 2001.
Citação norma MLABhabha Atomic Research Centre and N. K. Sahoo. Multimode Scanning Probe Microscopy in Characterizing Precision Optical Thin Films and Multilayers. Bhabha Atomic Research Centre, 2001.
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.