Journal of electronmicroscopy.
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OCLC: | 4578751 |
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Corporate Authors: | , |
Language: | English Japanese |
Published: |
Tokyo :
Society of Electron-Microscopy, Japan,
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Subjects: | |
Related Items: | Has supplement:
High voltage electron microscopy. Absorbed: Denshi kenbikyō (Tokyo, Japan : 1950) Continued in part by: Denshi kenbikyō |
Format: | Serial Note that CRL will digitize material from the collection when copyright allows. |
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Notes
C-17320 v.5-10 (1957-1961); LACKS: v.9, no.4Item List
Description | Local Call Number | Status |
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v.6 (1958) | C-17320 | Available |