Image interpretation for transmission electron microscopy of thin semiconductor layers and interfaces /

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Bibliographic Details
OCLC:23174106
Main Author: Jong, Alan Frank de
Corporate Author: Technische Hogeschool Delft
Language:English
Published: [S.l. : s.n.], 1990.
Subjects:
Transmission electron microscopes.
Image processing.
Semiconductors.
Thin films.
Halfgeleiders.
Galliumarsenide.
Aluminium.
Dunne films.
Grensvlakken.
Elektronenmicroscopie.
Beeldverwerking.
Format:

Thesis Monograph

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