Tiefenprofilanalyse an Metallen im Nanometerbereich mit elektrochemischer Schichtabtragung durch Elektropolieren /
Saved in:
OCLC: | 45923592 |
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Main Author: | |
Corporate Author: | |
Language: | German |
Published: |
Bamberg
1982.
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Format: | Thesis Monograph Note that CRL will digitize material from the collection when copyright allows. |
LEADER | 01132cam a2200289Mi 4500 | ||
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003 | OCoLC | ||
005 | 20070531093328.0 | ||
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040 | |a ZXW |b ger |c ZXW |d OCLCQ |d CRL | ||
049 | |a CRLL | ||
099 | |a P-00471400 | ||
100 | 1 | |a Krämer, Klaus. | |
245 | 1 | 0 | |a Tiefenprofilanalyse an Metallen im Nanometerbereich mit elektrochemischer Schichtabtragung durch Elektropolieren / |c Klaus Krämer. |
260 | |a Bamberg |c 1982. | ||
300 | |a 203 S : |b ill., graph. Darst. | ||
336 | |a text |b txt |2 rdacontent. | ||
337 | |a unmediated |b n |2 rdamedia. | ||
338 | |a volume |b nc |2 rdacarrier. | ||
502 | |b octoral |c Universität Stuttgart |d 1982. | ||
710 | 2 | |a Universität Stuttgart. | |
752 | |a Germany. | ||
907 | |a .b22478589 |b 04-18-22 |c 05-31-07 | ||
998 | |a diss |b 05-31-07 |c m |d - |e - |f ger |g gw |h 0 |i 1 | ||
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