Precision measurement of wavelengths and natural line widths of 3d-2p pionic x-ray transistion in low-Z atoms /

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Detalles Bibliográficos
OCLC:46169068
Autor Principal: Chambrier, Gilbert de
Autor Corporativo: Eidgenössische Technische Hochschule Zürich
Idioma:English
Publicado: 1984.
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Formato:

Thesis Monograph

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Descripción Local Call Number Status
P-00019290 Dispoñible