Precision measurement of wavelengths and natural line widths of 3d-2p pionic x-ray transistion in low-Z atoms /

Shranjeno v:
Bibliografske podrobnosti
OCLC:46169068
Glavni avtor: Chambrier, Gilbert de
Korporativna značnica: Eidgenössische Technische Hochschule Zürich
Jezik:English
Izdano: 1984.
Teme:
Format:

Thesis Monograph

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Opis Local Call Number Status
P-00019290 Prosto