Hierarchical test development and design-for-testability for (a)synchronous semi-custom ASICs : proefschrift
Gardado en:
| OCLC: | 34276168 |
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| Idioma: | English |
| Publicado: |
1993.
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| Subjects: | |
| Formato: | Thesis Monograph Note that CRL will digitize material from the collection when copyright allows. |